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Trace analysis on

Pure metals, semi-metals

Since materials are sensitive to impurity concentrations, it is needed to analyze the highly pure metals. The analysis is principally made on impurities (about 10 to 70 elements), which is technically needed and which makes sense to guarantee the required material quality.

Highly pure metals such as indium, gallium, germanium, silicon, scandium and rare earths can also be analyzed.
Apart from them, full analyzes can be carried out on almost all metals and semi-metals.

Examples:

Element	Purities	Sum of Impurities
Copper(Cu)	99.99% (4N)	<100 ppm
	99.999% (5N)	<10 ppm
	99.9999% (6N)	<1 ppm
Silver(Ag)	99.99% (4N)	<100 ppm
	99.999% (5N)	<10 ppm
Aluminium (Al)	99.99% (4N)	<100 ppm
	99.999% (5N)	<10 ppm

Alloys

Apart from the main alloy components in many special alloys, traces and ultra-trace impurities drastically change the properties and performance of the materials.

Example: highly heat-resistant nickel alloys

Presence of detrimental elements such as Lead (Pb), Tin (Sn), Antimony (Sb), Tellurium (Te), Thallium (Tl) or Cadmium (Cd) can influence the characteristics of the materials just in traces.

Materials properties can be also affected by doping with traces of certain elements in

Semi-conductor industry
High temperature behaviour of tungsten (W)

Non-Metals

Special sample preparation methods are used to analyze for purity of oxides (e.g. Al2O3) and other ceramic materials and compounds, e.g. Silicon carbide (SiC), silicon nitride (SiN), etc.

Quantitative depth profile analysis in coated materials

A layer thickness of down to a few micrometers (μm) in most conductive coating materials can be profiled by analyzing the traces composed in the layers of the materials.
Sectors for which our service included are:

Electronic industry
Semiconductor industry
Aviation, Aerospace
Automotive industry
Medical industry
Electroplating industry
Solar industry